Description
This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.
Product Details
- Edition:
- 1st
- Published:
- 01/01/1978
- ISBN(s):
- 0726215414
- Number of Pages:
- 13
- File Size:
- 1 file , 950 KB
- Product Code(s):
- 10171528
