ASTM F996-98(2003)

$29.00

Format: PDF      In Stock

 

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ASTM F996-98(2003)

$29.00

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
standard by ASTM International, 01/01/2003

Format: PDF      In Stock

 

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Description

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

Product Details

Published:
01/01/2003
Number of Pages:
7
File Size:
1 file , 89 KB

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