ASTM F980-10e1

$29.00

Format: PDF      In Stock

 

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ASTM F980-10e1

$29.00

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
standard by ASTM International, 12/01/2010

Format: PDF      In Stock

 

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Product Details

Published:
12/01/2010
Number of Pages:
7
File Size:
1 file , 160 KB

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