Description

BS PD IEC/TS 62916:2017 describes a discrete component bypass diode electrostatic discharge (ESD)immunity test and data analysis method. The test method described subjects a bypass diodeto a progressive ESD stress test and the analysis method provides a means for analyzing andextrapolating the resulting failures using the two-parameter Weibull distribution function.

It is the object of this document to establish a common and reproducible test method fordetermining diode surge voltage tolerance consistent with an ESD event during themanufacturing, packaging, transportation or installation processes of PV modules.

This document does not purport to address causes of electrostatic discharge or to establishpass or fail levels for bypass diode devices. It is the responsibility of the user to assess theESD exposure level for their particular circumstances. The data generated by this proceduremay support qualification of new design types, quality control for incoming material, and/oridentify the need for additional ESD controls in the manufacturing process.

Finally, this document does not apply to large energy surge events such as direct or indirectlightning exposure, utility capacitor bank switching events, or the like.

Cross References:
IEC 61000-4-2:2008 Ed 2

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:

06/28/2017

ISBN(s):

9780580896798

Number of Pages:

16

File Size:

1 file , 870 KB

Product Code(s):

30320854, 30320854, 30320854